JIS Work Programme, Revised JIS, Basic Engineering

PS-030-0150
JIS Work Programme
2026/02/03
No
Title
ICS No
Work
stage
International standard
Assigned Organization
Contact
A0204 Geological map-Symbols, colors, patterns, terms, and presentation of legend 1 National Institute of Advanced Industrial Science and Technology a
A0205 Vector-digital geological-map-Quality requirements and subject attribute codes 1 National Institute of Advanced Industrial Science and Technology a
B7502 Geometrical product specifications (GPS)-Dimensional measuring equipment-Micrometers 17.040.30 3 ISO 3611 Japan Precision Measuring Instruments Manufacturers Association a
B7524 Feeler gauges 1 Japan Precision Measuring Instruments Manufacturers Association a
B7525-1 Hydrometers-Part 1: Density hydrometers 17.060 4 ISO 387 Japan Measuring Instruments Federation a
B7525-3 Hydrometers-Part 3: Specific gravity meters 17.060 4 ISO 387 Japan Measuring Instruments Federation a
B7607 Automatic catchweighing instruments 17.060;17.100 4 OIML R 51-1 Japan Measuring Instruments Federation a
B7610 Pressure balances 17.060 5 OIML R110 ※Japanese Standards Association a
B7616 Operation and calibration procedures of pressure balances 17.060 5 ※Japanese Standards Association a
B7726 Rockwell hardness test-Verification and calibration of testing machines and indenters 2 ※Japanese Standards Association a
B7730 Rockwell hardness test-Calibration of reference blocks 2 ※Japanese Standards Association a
B7755 Metallic materials-Charpy V-notch pendulum impact test-Instrumented testing machine 77.040.10 5 ISO 14556 Japan Testing Machine Association a
K0148 Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy 71.040.40 5 ISO 14706 Japan National Committee for Standardization of Surface Chemical Analysis a
K0160 Surface chemical analysis-Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy 71.040.40 5 ISO 17331,ISO 17331 Amendment 1 Japan National Committee for Standardization of Surface Chemical Analysis a
P8113 Paper and board-Determination of tensile properties-Part 2: Constant rate of elongation method (20 mm/min) 85.060 4 ISO 1924-2 Japan Technical Association Of The Pulp And Paper Industry a
P8223 Pulps - Laboratory sheets - Determination of physical properties 1 Japan Technical Association Of The Pulp And Paper Industry a
Z2371 Methods of salt spray testing 1 Suga Weathering Technology Foundation a
Z6016 Process for receiving of document 01.140.30;35.240.30 4 Japan Image And Information Management Association a
Z8820-1 Determination of particle size distribution by gravitational liquid sedimentation methods ? Part 1: General principles, requirements and guidance 1 The Association Of Powder Process Industry And Engineering, Japan a
Z8823-1 Determination of particle size distribution by centrifugal liquid sedimentation methods Part 1: General principles, requirements and guidance 1 The Association Of Powder Process Industry And Engineering, Japan a
Z8829 Determination of particle size distribution and number concentration by particle tracking analysis (PTA) [Particle size analysis - Particle tracking analysis(PTA)method] 1 The Association Of Powder Process Industry And Engineering, Japan a
Z8830 Determination of the specific surface area of powders (solids) by gas adsorption-BET method 19.120 3 ISO 9277 The Association Of Powder Process Industry And Engineering, Japan a
Z8832 Determination of particle size distributions-Electrical sensing zone method 19.120 3 ISO 13319-1 The Association Of Powder Process Industry And Engineering, Japan a
Z9020-2 Control charts-Part 2: Shewhart control charts 03.120.30 5 ISO 7870-2 ※Japanese Standards Association a
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