Active Participation in International Standardization Activities

The Japanese Industrial Standards Committee (in which the standards Department serves as Secretariat) has actively participated in the international standardization activities as a sole member in Japan, of the International Organization for Standardization (ISO) (Another Website) since 1952, and of the International Electrotechnical Commission (IEC) (Another Website) since 1953, under the authorization of the Cabinet council (made up of all Ministers)

These activities include participation as a Participating (P) Member in Technical Committees (TCs), Sub-Committees (SCs) or Working Groups (WGs) which requires active participation in meetings and the obligation of voting.

In addition, Japan is vigorously taking on the role of Secretariat in 50 committees, consisting of 36 ISO, 11 IEC and 3 ISO/IEC joint committees (JTC1). The number of Secretariats assigned to JISC has increased recently, although the number remains relatively low compared to the major countries in the EU and the USA. Japan takes on the role of the Secretariats for ISO/TC206 (Fine Ceramics) and ISO/TC201 (Surface Chemical Analysis), reflecting the recommendation of ABTT advocated by the late ISO President, Mr. Isamu Yamashita. Recently, Japan added the role of the Secretariats for ISO/TC202 (Microbeam Analysis)/SC4 (Scanning Electron Microscopy), ISO/TC47 (Chemistry) and IEC/CISPR/I (Electromagnetic Compatibility of Information Technology Equipment, Multimedia Equipment and Receivers). Japan also takes on the role of international chairmanship in various TC/SCs, such as ISO/TC17 (Steel) and IEC/SC47C (Flat Panel Display Devices).

(as of September 2002)

JISC Participation Status for ISO
ISO	Participation Status				Total
ISO	S	P	O	N	Total
TC	9	136	34	7	186
SC	27	393	46	86	552
Total	36	529	80	93	738

JISC Participation Status for IEC
IEC	Participation Status				Total
IEC	S	P	O	N	Total
TC	4	85	0	0	89
SC	7	81	0	0	88
Total	11	166	0	0	177

JISC Participation Status for JISC1
JTC1	Participation Status				Total
JTC1	S	P	O	N	Total
TC	0	1	0	0	1
SC	3	14	0	0	17
Total	3	15	0		18

Secretariat for Technical Committees and Sub-Committees

(ISO)
TC	SC
8 (Ships and marine technology)	6 (Navigation) 9 (General requirements)
17(Steel)	1 (Methods of determination of chemical composition)
22 (Road vehicles)	22 (Motorcycles)
24 (Sieves, Sieving and sizing methods)	4 (Sizing by methods other than sieving)
25 (Cast iron and pig iron)	1 (Malleable case iron)
28 (Petroleum produce and lubricants)	5 (Measurement of light hydrocarbon fluids)
47 (Chemistry)
59 (Building Construction)	6 (Internal subdivision)
61 (Plastics)	11 (Products)
67 (Materials, equipment and offshore structures for petroleum and national gas products)	5 (Casing, tubing, and drill pipe)
69 (Applications of statistical methods)	6 (Measurement methods and results)
71 (Concrete,reinforced concrete and pre-stressed concrete)	6 (Non-traditional reinforcing materials for concrete structures)
79 (Light metals and their alloys)	4 (Unalloyed (Refined) aluminum ingots)
98 (Bases for design of structures)	3 (Loads, forces and other actions)
102 (lron ores)	1 (Sampling)
106 (Dentistry)	7 (Oral hygiene products)
114 (Horology)	11 (Indication of accuracy) 12(Antimagnetism)
127 (Earth-moving machinery)	3 (Operation and maintenance)
131 (Fluid power system)	7 (sealing devices )
135 (Non-destructive testing)	6 (Leak detection methods)
138(Plastics pipes, fittings and valves for the transport of fluids)
159 (Ergonomics)	3 (Anthropometry and biomechanics)
164 (Mechanical testing of metals)
201 (Surface chemical analysis)	4 (Depth profiling) 6 (Secondary ion mass spectrometry) 8 (Glow discharge spectroscopy)
202 (Microbeam analysis)	4 (Scanning electron microscopy)
206 (Fine Ceramics)

(IEC)
TC	SC
3 (Information Structures, documentationand graphical symbols)	C (Graphical symbols for use on equipment)
35 (Primary cells and batteries)
36 (Insulators)	C (Insulators for substatious)
47 (Semiconductor devices)	A (Integrated circuits) C (Flat panel display devices)
51 (Magnetic components and ferrite materials)
59 (Performance of household electrical appliances)	E (Ironing and pressing appliances)
90 (Superconductivity)
91 (Surface mounting technology)
CISPR	B (Interference relating to industrial, scientific and medical radio-drequency apparatus)
CISPR	I (Electromagnetic compatibility of information technology equipment, multimedia equipment and receivers)

(ISO/IEC/JTC1)
SC
2 (Coded character sets)
23 (Optical disk cartridges for information)
29 (Coded representation of picture, audio and multimedia/hypermedia information)

Note: Japan also in charge of secretariat underlined TC